In situ TEM study of cubic zirconia implanted with caesium ions

Journal of Nuclear Materials

Volumn 381, Issue 3, 2008, Pages 297-301

  Gentils, A ^a   Ruault, M O ^a   Thome L ^a  

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; DEFECTS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IN SITU PROCESSING; ION BEAMS; IONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; YTTRIA STABILIZED ZIRCONIA; YTTRIUM OXIDE; ZIRCONIA;

CUBIC ZIRCONIA; DEFECT CLUSTER; FLUENCES; IN SITU TRANSMISSION ELECTRON MICROSCOPY (TEM); IN-SITU TEM; ION BEAM ANALYSIS TECHNIQUES; ION FLUENCES; ION IMPLANTED;

ION IMPLANTATION;

EID: 54949117869     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2008.09.002     Document Type: Article

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