Fault localization through evaluation sequences

Journal of Systems and Software

Volumn 83, Issue 2, 2010, Pages 174-187

  Zhang, Zhenyu ^a   Jiang, Bo ^a   Chan, W K ^b   Tse, T H ^a   Wang, Xinming ^c  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^c HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Boolean expression; Evaluation sequence; Fault localization; Predicate

Indexed keywords

ATOMIC UNITS; BOOLEAN EXPRESSIONS; CIRCUIT EVALUATION; EVALUATION RESULTS; EVALUATION SEQUENCE; FAULT LOCALIZATION; LOCALIZATION TECHNIQUE; ON DYNAMICS; PROGRAM EXECUTION; PROGRAM STATEMENTS; SIEMENS;

EID: 73149118240     PISSN: 01641212     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jss.2009.09.041     Document Type: Article

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