A practical evaluation of spectrum-based fault localization

Journal of Systems and Software

Volumn 82, Issue 11, 2009, Pages 1780-1792

  Abreu, Rui ^a   Zoeteweij, Peter ^a   Golsteijn, Rob ^b   van Gemund, Arjan J C ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

Consumer electronics; Program spectra; Real time and embedded systems; Software fault diagnosis; Test data analysis

Indexed keywords

AUTOMATED DIAGNOSIS; CONTROLLED ENVIRONMENT; DEBUGGING EFFORTS; DIAGNOSTIC ACCURACY; EMBEDDED SOFTWARE DEVELOPMENT; ERROR OBSERVATION; FAULT LOCALIZATION; INDUSTRIAL ENVIRONMENTS; LIGHT WEIGHT; LOW QUALITIES; PROGRAM SPECTRA; REAL-TIME AND EMBEDDED SYSTEMS; SIEMENS; SIMILARITY COEFFICIENTS; SOFTWARE FAULT DIAGNOSIS; SPACE PROGRAMS; SYSTEM FAILURES; TEST CASE; TEST DATA ANALYSIS; TEST DESIGNS;

BENCHMARKING; COMPUTER SOFTWARE SELECTION AND EVALUATION; CONSUMER ELECTRONICS; DATA HANDLING; EMBEDDED SOFTWARE; EMBEDDED SYSTEMS; FAILURE ANALYSIS; OPTIMAL SYSTEMS; PLASMA DIAGNOSTICS; REAL TIME SYSTEMS; SYSTEMS ENGINEERING; TEST FACILITIES; TESTING;

PROGRAM DIAGNOSTICS;

EID: 71749095111     PISSN: 01641212     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jss.2009.06.035     Document Type: Article

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