An empirical study of the effects of test-suite reduction on fault localization

Proceedings - International Conference on Software Engineering

Volumn , Issue , 2008, Pages 201-210

  Yu, Yanbing ^b   Jones, James A ^a   Harrold, Mary Jean ^b  

^a Georgia Institute of Technology   (United States)

^b NONE

Author keywords

Empirical study; Fault localization; Test suite reduction

Indexed keywords

EXPERIMENTS; SOFTWARE ENGINEERING; COMPUTER SOFTWARE;

EMPIRICAL STUDY; EXPERIMENT STUDIES; FAULT LOCALIZATION; LOCALIZATION TECHNIQUES; TEST CASE; TEST-SUITE REDUCTION;

TESTING;

EMPIRICAL STUDIES; EMPIRICAL STUDY; EXPERIMENT STUDY; FAULT LOCALIZATION; LOCALIZATION TECHNIQUE; TEST CASE; TEST-SUITE REDUCTION;

EID: 57349154284     PISSN: 02705257     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1368088.1368116     Document Type: Conference Paper

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