Scalable statistical bug isolation

Proceedings of the ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI)

Volumn , Issue , 2005, Pages 15-26

  Liblit, Ben ^a   Naik, Mayur ^b   Zheng, Alice X ^c   Aiken, Alex ^b   Jordan, Michael I ^c  

^a University of Wisconsin Madison   (United States)

^b Stanford University   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Bug isolation; Feature selection; Invariants; Random sampling; Statistical debugging

Indexed keywords

ALGORITHMS; COMPUTER PROGRAMMING; FAILURE ANALYSIS; STATISTICAL METHODS;

BUG ISOLATION; FEATURE SELECTION; INVARIANTS; RANDOM SAMPLING;

PROGRAM DEBUGGING;

EID: 31844452362     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1065010.1065014     Document Type: Conference Paper

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