-
1
-
-
34548272571
-
Statistical debugging using compound Boolean predicates
-
ACM Press, New York, NY
-
P. Arumuga Nainar, T. Chen, J. Rosin, and B. Liblit. Statistical debugging using compound Boolean predicates. In Proceedings of the 2007 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA. 2007), pages 5-15. ACM Press, New York, NY, 2007.
-
(2007)
Proceedings of the 2007 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA. 2007)
, pp. 5-15
-
-
Arumuga Nainar, P.1
Chen, T.2
Rosin, J.3
Liblit, B.4
-
2
-
-
34247095930
-
Improving test suites for efficient fault localization
-
ACM Press, New York, NY
-
B. Baudry, F. Fleurey, and Y. Le Traon. Improving test suites for efficient fault localization. In Proceedings of the 28th International Conference on Software Engineering (ICSE 2006). ACM Press, New York, NY, 2006.
-
(2006)
Proceedings of the 28th International Conference on Software Engineering (ICSE 2006)
-
-
Baudry, B.1
Fleurey, F.2
Le Traon, Y.3
-
5
-
-
26044480846
-
Supporting controlled experimentation with testing techniques: An infrastructure and its potential impact
-
H. Do, S. G. Elbaum, and G. Rothermel. Supporting controlled experimentation with testing techniques: an infrastructure and its potential impact. Empirical Software Engineering, 10 (4): 405-435, 2005.
-
(2005)
Empirical Software Engineering
, vol.10
, Issue.4
, pp. 405-435
-
-
Do, H.1
Elbaum, S.G.2
Rothermel, G.3
-
6
-
-
34248655664
-
-
A. Griesmayer, S. Staber, and R. Bloem. Automated Fault Localization for C Programs. Electron. Notes Theor. Comput. Sci., 174(4): 157110661, 2007.
-
A. Griesmayer, S. Staber, and R. Bloem. Automated Fault Localization for C Programs. Electron. Notes Theor. Comput. Sci., 174(4): 157110661, 2007.
-
-
-
-
7
-
-
0028166441
-
Experiments on the effectiveness of dataflow- and controlflow-based test adequacy criteria
-
IEEE Computer Society Press, Los Alamitos, CA
-
M. Hutchins, H. Foster, T. Goradia, and T. Ostrand. Experiments on the effectiveness of dataflow- and controlflow-based test adequacy criteria. In Proceedings of the 16th International Conference on Software Engineering (ICSE '94), pages 191-200. IEEE Computer Society Press, Los Alamitos, CA, 1994.
-
(1994)
Proceedings of the 16th International Conference on Software Engineering (ICSE '94)
, pp. 191-200
-
-
Hutchins, M.1
Foster, H.2
Goradia, T.3
Ostrand, T.4
-
8
-
-
34548241212
-
Debugging in parallel
-
ACM Press, New York, NY
-
J.A. Jones, M.J. Harrold, and J.F. Bowring. Debugging in parallel. In Proceedings of the 2007 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2007), pages 16-26. ACM Press, New York, NY, 2007.
-
(2007)
Proceedings of the 2007 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2007)
, pp. 16-26
-
-
Jones, J.A.1
Harrold, M.J.2
Bowring, J.F.3
-
9
-
-
0036040176
-
Visualization of test information to assist fault localization
-
ACM Press, New York, NY
-
J. A. Jones, M. J. Harrold, and J. Stasko. Visualization of test information to assist fault localization. In Proceedings of the 24th International Conference on Software Engineering (ICSE 2002), pages 467-477. ACM Press, New York, NY, 2002.
-
(2002)
Proceedings of the 24th International Conference on Software Engineering (ICSE 2002)
, pp. 467-477
-
-
Jones, J.A.1
Harrold, M.J.2
Stasko, J.3
-
10
-
-
31844452362
-
Scalable statistical bug isolation
-
SIGPLAN Notices
-
B. Liblit, M. Naik, A.X. Zheng, A. Aiken, and M.I. Jordan. Scalable statistical bug isolation, in Proceedings of the 2005 ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI 2005), ACM SIGPLAN Notices, 40(6): 15-26, 2005.
-
(2005)
Proceedings of the 2005 ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI 2005), ACM
, vol.40
, Issue.6
, pp. 15-26
-
-
Liblit, B.1
Naik, M.2
Zheng, A.X.3
Aiken, A.4
Jordan, M.I.5
-
11
-
-
33947095875
-
Statistical debugging: A hypothesis testing-based approach
-
C. Liu, L. Fei, X. Yan, S. P. Midkiff, and J. Han. Statistical debugging: a hypothesis testing-based approach. IEEE Transactions on Software Engineering, 32(10): 831-848, 2006.
-
(2006)
IEEE Transactions on Software Engineering
, vol.32
, Issue.10
, pp. 831-848
-
-
Liu, C.1
Fei, L.2
Yan, X.3
Midkiff, S.P.4
Han, J.5
-
12
-
-
32344442835
-
SOBER: Statistical model-based bug localization
-
C. Liu, X. Yan, L. Fei, J. Han, and S. P. Midkiff. SOBER: statistical model-based bug localization. In Proceedings of the Joint 10th European Software Engineering Conference and 13th ACM SIGSOFT International Symposium on Foundation of Software Engineering (ESEC 2005/FSE-13), ACM SIGSOFT Software Engineering Notes, 30 (5): 286-295, 2005.
-
(2005)
Proceedings of the Joint 10th European Software Engineering Conference and 13th ACM SIGSOFT International Symposium on Foundation of Software Engineering (ESEC 2005/FSE-13), ACM SIGSOFT Software Engineering Notes
, vol.30
, Issue.5
, pp. 286-295
-
-
Liu, C.1
Yan, X.2
Fei, L.3
Han, J.4
Midkiff, S.P.5
-
14
-
-
0022162219
-
Expertise in debugging computer programs: A process analysis
-
I. Vessey. Expertise in debugging computer programs: a process analysis. International Journal of Man-Machine Studies, 23 (5): 459-494, 1985.
-
(1985)
International Journal of Man-Machine Studies
, vol.23
, Issue.5
, pp. 459-494
-
-
Vessey, I.1
-
16
-
-
33749257127
-
Statistical debugging: Simultaneous identification of multiple bugs
-
ACM Press, New York, NY
-
A.X. Zheng, M.I. Jordan, B. Liblit, M. Naik, and A. Aiken. Statistical debugging: simultaneous identification of multiple bugs. In Proceedings of the 23rd International Conference on Machine Learning (ICML 2006), pages 1105-1112. ACM Press, New York, NY, 2006.
-
(2006)
Proceedings of the 23rd International Conference on Machine Learning (ICML 2006)
, pp. 1105-1112
-
-
Zheng, A.X.1
Jordan, M.I.2
Liblit, B.3
Naik, M.4
Aiken, A.5
|