Taming coincidental correctness: Coverage refinement with context patterns to improve fault localization

Proceedings - International Conference on Software Engineering

Volumn , Issue , 2009, Pages 45-55

  Wang, Xinming ^a   Cheung, S C ^a   Chan, W K ^b   Zhang, Zhenyu ^c  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^c UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CODE COVERAGE; CONTEXT PATTERNS; DATAFLOW PATTERNS; EXPERIMENTAL EVIDENCE; FAULT LOCALIZATION; FAULT TYPES; HIGH COSTS; MUTATION ANALYSIS; TEST RUNS;

COMPUTER SOFTWARE; DATA FLOW ANALYSIS;

SAFETY ENGINEERING;

EID: 69749107742     PISSN: 02705257     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSE.2009.5070507     Document Type: Conference Paper

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