|
Volumn , Issue , 2009, Pages 464-467
|
A 0.45pJ/conv-step 1.2Gs/s 6b full-Nyquist non-calibrated flash ADC in 45nm CMOS and its scaling behavior
|
Author keywords
[No Author keywords available]
|
Indexed keywords
45NM TECHNOLOGY;
AD CONVERTERS;
CMOS PROCESSS;
CMOS TECHNOLOGY;
DEVICE PROPERTIES;
FLASH-ADC;
FULL NYQUIST;
FULL OPTIMIZATION;
NYQUIST;
POWER EFFICIENT;
SCALING ANALYSIS;
SCALING BEHAVIOR;
MULTICARRIER MODULATION;
|
EID: 72849110692
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ESSCIRC.2009.5326002 Document Type: Conference Paper |
Times cited : (8)
|
References (10)
|