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Volumn , Issue , 2004, Pages 57-63

Assessment of the merits of CMOS technology scaling for analog circuit design

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; APPROXIMATION THEORY; BOUNDARY CONDITIONS; CAPACITANCE; COMPUTER SIMULATION; DIGITAL CIRCUITS; ELECTRIC CURRENTS; LOGIC DESIGN; MOS DEVICES;

EID: 17644388863     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (14)

References (11)
  • 1
    • 0035423685 scopus 로고    scopus 로고
    • RF-CMOS performance trends
    • Aug.
    • Woerlee, P.M. et.al; "RF-CMOS performance trends", IEEE Transactions on Electron Devices, Volume: 48, Issue: 8, Aug. 2001 Pages: 1776-1782
    • (2001) IEEE Transactions on Electron Devices , vol.48 , Issue.8 , pp. 1776-1782
    • Woerlee, P.M.1
  • 2
    • 0031188590 scopus 로고    scopus 로고
    • CMOS technology for mixed signal ICs
    • M.J.M. Pelgrom, M. Vertregt "CMOS Technology for Mixed Signal ICs", Solid-State Electronics Vol.41, No.7, pp. 967-974, 1997
    • (1997) Solid-state Electronics , vol.41 , Issue.7 , pp. 967-974
    • Pelgrom, M.J.M.1    Vertregt, M.2
  • 3
    • 33746329247 scopus 로고    scopus 로고
    • Scalable high-speed analog circuit design
    • Kluwer Academic Publishers
    • M.Vertregt et.al; "Scalable high-speed analog circuit design", 2001 AACD, Kluwer Academic Publishers, pp. 3-21, 2002.
    • (2002) 2001 AACD , pp. 3-21
    • Vertregt, M.1
  • 4
    • 28444444398 scopus 로고    scopus 로고
    • Philips Research Laboratories, MOS Model 11, level 1102 http://www.semiconductors.philips.com/Philips Models/mos models/
    • MOS Model 11, Level 1102
  • 6
    • 0442271981 scopus 로고    scopus 로고
    • Compact modelling of pocket-implanted MOSFETs
    • Scholten, A.J. et.al; "Compact modelling of pocket-implanted MOSFETs"; Proceedings ESSDERC'01, pp. 311-314, 2001
    • (2001) Proceedings ESSDERC'01 , pp. 311-314
    • Scholten, A.J.1
  • 7
    • 0024754187 scopus 로고
    • Matching properties of MOS transistors
    • M.J.M. Pelgrom et.al.; "Matching properties of MOS transistors", IEEE Journal of Solid-State Circuits, Vol. SC-24, pp. 1433-1440, 1989
    • (1989) IEEE Journal of Solid-state Circuits , vol.SC-24 , pp. 1433-1440
    • Pelgrom, M.J.M.1
  • 9
    • 0035509999 scopus 로고    scopus 로고
    • A mixed-signal design roadmap
    • Nov.-Dec.
    • R. Brederlow et.al, "A mixed-signal Design Roadmap" IEEE-Design-Test-of-Computers (USA), vol.18, no.6, p.34-46, Nov.-Dec. 2001
    • (2001) IEEE-design-test-of-computers (USA) , vol.18 , Issue.6 , pp. 34-46
    • Brederlow, R.1
  • 10
    • 2442640106 scopus 로고    scopus 로고
    • Designing outside rail constraints
    • Annema, A.J. et.al; "Designing outside rail constraints", proceedings ISSCC 2004, pp. 134-135
    • Proceedings ISSCC 2004 , pp. 134-135
    • Annema, A.J.1
  • 11
    • 0036917305 scopus 로고    scopus 로고
    • 6-bit 1.6-Gsample/s flash ADC in 0.18-μm CMOS using averaging termination
    • December
    • P. Scholtens et al., "6-bit 1.6-Gsample/s flash ADC in 0.18-μm CMOS Using Averaging Termination," IEEE J. Solid-State Circuits, vol 37 pp. 1599-1609, December 2002.
    • (2002) IEEE J. Solid-state Circuits , vol.37 , pp. 1599-1609
    • Scholtens, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.