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Volumn 110, Issue 2, 2010, Pages 162-169
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Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuum
a
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Author keywords
Kelvin force microscopy; Non contact atomic force microscopy (AFM)
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Indexed keywords
ACQUISITION RATES;
AMPLITUDE DETECTION;
ARTEFACT REDUCTION;
BENEFICIAL EFFECTS;
CONTROL LOOP;
DISTANCE CONTROL;
DYNAMIC BEHAVIORS;
EXPERIMENTAL PROCEDURE;
FREQUENCY DOMAINS;
KELVIN FORCE MICROSCOPES;
KELVIN FORCE MICROSCOPY;
NOISE LEVELS;
NOISE SOURCE;
NONCONTACT ATOMIC FORCE MICROSCOPY;
OUTPUT SIGNAL;
PERFORMANCE CRITERION;
PERFORMANCE LIMITATIONS;
SAMPLING FREQUENCIES;
SCANNING PROBES;
SYSTEM DESIGN;
DIGITAL SIGNAL PROCESSING;
DYNAMIC RESPONSE;
FEEDBACK;
FREQUENCY RESPONSE;
IMAGING TECHNIQUES;
POWER SPECTRAL DENSITY;
REMOTE CONTROL;
SIGNAL DETECTION;
SIGNAL PROCESSING;
VACUUM;
ATOMIC FORCE MICROSCOPY;
AMPLITUDE MODULATION;
ARTICLE;
ARTIFACT REDUCTION;
CONTROLLED STUDY;
KEVIN FORCE MICROSCOPY;
PERFORMANCE;
SCANNING FORCE MICROSCOPY;
SCANNING PROBE MICROSCOPY;
SIGNAL NOISE RATIO;
SIGNAL PROCESSING;
VACUUM;
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EID: 72749089139
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2009.10.016 Document Type: Article |
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Times cited : (11)
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References (9)
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