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Physical Review Letters

Volumn 103, Issue 25, 2009, Pages

Measurements of surface diffusivity and coarsening during pulsed laser deposition

(5) Ferguson, J D a,b Arikan, G a,b Dale, D S b Woll, A R b Brock, J D a,b

a Cornell University (United States)

b Department of Obstetrics Gynecology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSE X-RAY SCATTERING; DIFFUSIVITIES; DIRECT MEASUREMENT; EHRLICH-SCHWOEBEL BARRIER; HOMOEPITAXIAL; IN-SITU; INTERLAYER DIFFUSION; INTRA-LAYER; LENGTH SCALE; SURFACE DIFFUSIVITY; UPPER BOUND; X-RAY SPECULAR REFLECTIVITY;

DIFFUSION; PROGRAMMABLE LOGIC CONTROLLERS; PULSED LASER DEPOSITION; X RAY SCATTERING;

SURFACE MORPHOLOGY;

EID: 72649100224 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.103.256103 Document Type: Article

Times cited : (68)

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