Determination of kinetic parameters in layer-by-layer growth from RHEED profile analysis

Thin Solid Films

Volumn 423, Issue 1, 2003, Pages 64-69

  Dulot, F ^a   Kierren, B ^a   Malterre, D ^a  

^a INSTITUT JEAN LAMOUR   (France)

Author keywords

Growth mechanism; High energy electron diffraction; Iron; Surface diffusion

Indexed keywords

DIFFUSION; KINETIC THEORY; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA;

KINETIC PARAMETERS;

REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;

EID: 0037215763     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00990-2     Document Type: Article

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