Off-specular X-ray scattering studies of the morphology of thin films

Physica A: Statistical Mechanics and its Applications

Volumn 231, Issue 1-3, 1996, Pages 99-110

  Sinha, S K ^a   Feng, Y P ^a   Melendres, C A ^b   Lee, D D ^c   Russell, T P ^d   Satija, S K ^e   Sirota, E B ^f   Sanyal, M K ^g  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Massachusetts Institute of Technology Cambridge   (United States)

^d IBM ALMADEN RESEARCH CENTER   (United States)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^f EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

^g SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCK COPOLYMERS; COPPER; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; INTERFACES (MATERIALS); MORPHOLOGY; PITTING; PLASTIC FILMS; SCATTERING; SOLUTIONS; SURFACES; THIN FILMS;

DIFFUSE SCATTERING; X RAY SPECULAR REFLECTIVITY;

X RAYS;

EID: 0030246341     PISSN: 03784371     EISSN: None     Source Type: Journal    
DOI: 10.1016/0378-4371(96)00085-4     Document Type: Article

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