-
1
-
-
47249135506
-
A high-frequency resonant inverter topology with low-voltage stress
-
July
-
J. M. Rivas, Y. Han, O. Leitermann, A. D. Sagneri, and D. J. Perreualt, "A high-frequency resonant inverter topology with low-voltage stress," IEEE Transactions on Power Electronics, vol. 23, pp. 1759-1771, July 2008.
-
(2008)
IEEE Transactions on Power Electronics
, vol.23
, pp. 1759-1771
-
-
Rivas, J.M.1
Han, Y.2
Leitermann, O.3
Sagneri, A.D.4
Perreualt, D.J.5
-
2
-
-
52349113610
-
High frequency resonant sepic converter with wide input and output voltage ranges
-
June
-
J. Hu, A. D. Sagneri, J. M. Rivas, S. M. Davis, and D. J. Perreault, "High frequency resonant sepic converter with wide input and output voltage ranges," in Power Electronics Specialist Conference Proceedings 2008, June 2008.
-
(2008)
Power Electronics Specialist Conference Proceedings 2008
-
-
Hu, J.1
Sagneri, A.D.2
Rivas, J.M.3
Davis, S.M.4
Perreault, D.J.5
-
3
-
-
85008020492
-
Very-high-frequency resonant boost converters
-
R. C. N. Pilawa-Podgurski, A. D. Sagneri, J. M. Rivas, D. I. Anderson, and D. J. Perreault, "Very-high-frequency resonant boost converters," IEEE Transactions on Power Electronics, vol. 24, pp. 1654-1665, 2009.
-
(2009)
IEEE Transactions on Power Electronics
, vol.24
, pp. 1654-1665
-
-
Pilawa-Podgurski, R.C.N.1
Sagneri, A.D.2
Rivas, J.M.3
Anderson, D.I.4
Perreault, D.J.5
-
4
-
-
0025403853
-
-
Z. Parpia and C. A. T. Salama, Optimization of RESURF LDMOS transistors: An analytical approach, IEEE Transactions on Electron Devices, 37, pp. 789-796, March 1990.
-
Z. Parpia and C. A. T. Salama, "Optimization of RESURF LDMOS transistors: An analytical approach," IEEE Transactions on Electron Devices, vol. Vol. 37, pp. 789-796, March 1990.
-
-
-
-
5
-
-
34548810850
-
-
T. Biondi, G. Greco, M. C. Allia, S. F. Liotta, G. Bazzano, and S. Rinaudo, Distributed modeling of layout parasitics in large-area highspeed silicon power devices, IEEE Transactions on Power Electronics, 22, pp. 1847-1856, September 2007.
-
T. Biondi, G. Greco, M. C. Allia, S. F. Liotta, G. Bazzano, and S. Rinaudo, "Distributed modeling of layout parasitics in large-area highspeed silicon power devices," IEEE Transactions on Power Electronics, vol. Vol. 22, pp. 1847-1856, September 2007.
-
-
-
-
6
-
-
0033733053
-
Hot carrier reliability of lateral dmos transistors
-
V. O'Donovan, S. Whiston, A. Deignan, and C. N. Chleirigh, "Hot carrier reliability of lateral dmos transistors," in 38th Annual International Reliability Physics Symposium, 2000.
-
(2000)
38th Annual International Reliability Physics Symposium
-
-
O'Donovan, V.1
Whiston, S.2
Deignan, A.3
Chleirigh, C.N.4
-
7
-
-
48349113766
-
Very high frequency resonant boost converters
-
Orlando, FL, June
-
R. C. N. Pilawa-Podgurski, A. D. Sagneri, J. M. Rivas, D. I. Anderson, and D. J. Perreault., "Very high frequency resonant boost converters," in Power Electronics Specialists Conference, (Orlando, FL), June 2007.
-
(2007)
Power Electronics Specialists Conference
-
-
Pilawa-Podgurski, R.C.N.1
Sagneri, A.D.2
Rivas, J.M.3
Anderson, D.I.4
Perreault, D.J.5
-
8
-
-
66049127298
-
Opportunities and challenges in very high frequency power conversion
-
D. J. Perreault, J. Hu, J. M. Rivas, Y. Han, O. Leitermann, R. C. N. Pilawa-Podgurski, A. D. Sagneri, and C. R. Sullivan, "Opportunities and challenges in very high frequency power conversion," in To be published in the proceedings of the Applied Power Electronics Conference and Exposition, 2009.
-
(2009)
To be published in the proceedings of the Applied Power Electronics Conference and Exposition
-
-
Perreault, D.J.1
Hu, J.2
Rivas, J.M.3
Han, Y.4
Leitermann, O.5
Pilawa-Podgurski, R.C.N.6
Sagneri, A.D.7
Sullivan, C.R.8
-
9
-
-
33644893868
-
New architectures for radio-frequency dc/dc power conversion
-
March
-
J. Rivas, J. Shafran, R. Wahby, and D. Perreault, "New architectures for radio-frequency dc/dc power conversion," IEEE Transactions on Power Electronics, vol. 21, pp. 380-393, March 2006.
-
(2006)
IEEE Transactions on Power Electronics
, vol.21
, pp. 380-393
-
-
Rivas, J.1
Shafran, J.2
Wahby, R.3
Perreault, D.4
-
10
-
-
0009924010
-
Class-E RF Power Amplifiers
-
Jan/Feb
-
N. O. Sokal, "Class-E RF Power Amplifiers," QEX, pp. 9-20, Jan/Feb 2001.
-
(2001)
QEX
, pp. 9-20
-
-
Sokal, N.O.1
-
12
-
-
33750796472
-
-
D. Brisbin, P. Lindorfer, and P. Chaparala, Anomalous safe operating area and hot carrier degredation of nldmos devices, Device and Materials Reliability, IEEE Transactions on, 6, No.3, pp. 364-370, 2006.
-
D. Brisbin, P. Lindorfer, and P. Chaparala, "Anomalous safe operating area and hot carrier degredation of nldmos devices," Device and Materials Reliability, IEEE Transactions on, vol. Vol. 6, No.3, pp. 364-370, 2006.
-
-
-
-
13
-
-
34548805918
-
A compreshensive model for hot carrier degredation in ldmos transistors
-
P. Moens, J. Mertens, F. Bauwens, P. Joris, W. D. Ceuninck, and M. Tack, "A compreshensive model for hot carrier degredation in ldmos transistors," in IEEE 45th Annual International Reliability Physics Symposium, 2007.
-
(2007)
IEEE 45th Annual International Reliability Physics Symposium
-
-
Moens, P.1
Mertens, J.2
Bauwens, F.3
Joris, P.4
Ceuninck, W.D.5
Tack, M.6
-
14
-
-
5444222133
-
-
P. Moens, G. V. den Bosch, C. D. Keukeleire, R. Degraeve, M. Tack, and G. Groeseneken, Hot hole degredation effects in lateral ndmos transistors, Electron Devices, IEEE Transactions on, 51, No. 10, pp. 1704-1710, 2004.
-
P. Moens, G. V. den Bosch, C. D. Keukeleire, R. Degraeve, M. Tack, and G. Groeseneken, "Hot hole degredation effects in lateral ndmos transistors," Electron Devices, IEEE Transactions on, vol. Vol. 51, No. 10, pp. 1704-1710, 2004.
-
-
-
|