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Volumn , Issue , 2009, Pages 1590-1602

Optimization of transistors for very high frequency dc-dc converters

Author keywords

Class inverter; Class E inverter; Class F power amplifier; Harmonic peaking; Resonant boost converter; Resonant dc dc converter; Resonant gate drive; Resonant rectifier; Self oscillating gate drive; Very high frequency; VHF integrated power converter

Indexed keywords

CLASS E INVERTER; CLASS F POWER AMPLIFIER; HARMONIC PEAKING; RESONANT BOOST CONVERTER; RESONANT DC-DC CONVERTER; RESONANT GATE DRIVE; RESONANT RECTIFIER; SELF-OSCILLATING GATE DRIVE; VERY HIGH FREQUENCY; VHF INTEGRATED POWER CONVERTER;

EID: 72449160570     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCE.2009.5316121     Document Type: Conference Paper
Times cited : (15)

References (15)
  • 4
    • 0025403853 scopus 로고    scopus 로고
    • Z. Parpia and C. A. T. Salama, Optimization of RESURF LDMOS transistors: An analytical approach, IEEE Transactions on Electron Devices, 37, pp. 789-796, March 1990.
    • Z. Parpia and C. A. T. Salama, "Optimization of RESURF LDMOS transistors: An analytical approach," IEEE Transactions on Electron Devices, vol. Vol. 37, pp. 789-796, March 1990.
  • 5
    • 34548810850 scopus 로고    scopus 로고
    • T. Biondi, G. Greco, M. C. Allia, S. F. Liotta, G. Bazzano, and S. Rinaudo, Distributed modeling of layout parasitics in large-area highspeed silicon power devices, IEEE Transactions on Power Electronics, 22, pp. 1847-1856, September 2007.
    • T. Biondi, G. Greco, M. C. Allia, S. F. Liotta, G. Bazzano, and S. Rinaudo, "Distributed modeling of layout parasitics in large-area highspeed silicon power devices," IEEE Transactions on Power Electronics, vol. Vol. 22, pp. 1847-1856, September 2007.
  • 10
    • 0009924010 scopus 로고    scopus 로고
    • Class-E RF Power Amplifiers
    • Jan/Feb
    • N. O. Sokal, "Class-E RF Power Amplifiers," QEX, pp. 9-20, Jan/Feb 2001.
    • (2001) QEX , pp. 9-20
    • Sokal, N.O.1
  • 12
    • 33750796472 scopus 로고    scopus 로고
    • D. Brisbin, P. Lindorfer, and P. Chaparala, Anomalous safe operating area and hot carrier degredation of nldmos devices, Device and Materials Reliability, IEEE Transactions on, 6, No.3, pp. 364-370, 2006.
    • D. Brisbin, P. Lindorfer, and P. Chaparala, "Anomalous safe operating area and hot carrier degredation of nldmos devices," Device and Materials Reliability, IEEE Transactions on, vol. Vol. 6, No.3, pp. 364-370, 2006.
  • 14
    • 5444222133 scopus 로고    scopus 로고
    • P. Moens, G. V. den Bosch, C. D. Keukeleire, R. Degraeve, M. Tack, and G. Groeseneken, Hot hole degredation effects in lateral ndmos transistors, Electron Devices, IEEE Transactions on, 51, No. 10, pp. 1704-1710, 2004.
    • P. Moens, G. V. den Bosch, C. D. Keukeleire, R. Degraeve, M. Tack, and G. Groeseneken, "Hot hole degredation effects in lateral ndmos transistors," Electron Devices, IEEE Transactions on, vol. Vol. 51, No. 10, pp. 1704-1710, 2004.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.