Charge generation by secondary particles from nuclear reactions in BEOL materials

IEEE Transactions on Nuclear Science

Volumn 56, Issue 6, 2009, Pages 3172-3179

  Dodds, N A ^a   Reed, R A ^a   Mendenhall, M H ^a   Weller, R A ^a   Clemens, M A ^a   Dodd, P E ^b   Shaneyfelt, M R ^b   Vizkelethy, G ^b   Schwank, J R ^b   Ferlet Cavrois, V ^c,d   Adams Jr , J H ^e   Schrimpf, R D ^a   King, M P ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c DIF   (France)

^d EUROPEAN SPACE AGENCY   (Netherlands)

^e NASA MARSHALL SPACE FLIGHT CENTER   (United States)

Author keywords

Charge collection; High z; Indirect ionization; Monte carlo; Mred; Nuclear reactions; Secondary particles; Worst case energy

Indexed keywords

BEOL MATERIALS; CHARGE COLLECTION; CHARGE GENERATION; DEVICE LAYOUT; DIRECT CHARGE; HIGH ENERGY; INCIDENT IONS; INCIDENT PARTICLES; INDUCED CHARGES; LINEAR ENERGY TRANSFER; MONTE CARLO; MONTE CARLO APPROACH; NUCLEAR REACTIONS; PARTICLE ENERGY; SECONDARY PARTICLES; SENSITIVE VOLUME; SIMULATION RESULT; SINGLE EVENT EFFECTS;

ENERGY TRANSFER; IONIZATION; LIGHTING FIXTURES; MONTE CARLO METHODS; NUCLEAR ENERGY; NUCLEAR PHYSICS; PARTICLE DETECTORS; TUNGSTEN;

NUCLEAR REACTORS;

EID: 72349093423     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2034160     Document Type: Conference Paper

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