Static and dynamic test of high resolution DAC based on over sampling and low resolution ADC

Measurement: Journal of the International Measurement Confederation

Volumn 43, Issue 2, 2010, Pages 262-273

  Carnì, Domenico Luca ^a   Grimaldi, Domenico ^a  

^a UNIVERSITY OF CALABRIA   (Italy)

Author keywords

Digital to analog converter; Dynamic test; Static test; Zero crossing

Indexed keywords

DIGITAL-TO-ANALOG CONVERTERS; DYNAMIC TESTS; HIGH RESOLUTION; HIGH-SPEED SIGNALS; LOW RESOLUTION; LOWER RESOLUTION; NUMERICAL TESTS; OUTPUT VOLTAGES; OVER SAMPLING; PERIODIC REFERENCE; REFERENCE SIGNALS; SIGNAL ACQUISITIONS; SPECTRAL ANALYSIS; STATIC AND DYNAMIC; STATIC TESTS; ZERO-CROSSINGS;

CROSSINGS (PIPE AND CABLE); DIGITAL INTEGRATED CIRCUITS; DIGITAL TO ANALOG CONVERSION; ELECTRIC LOAD SHEDDING; MULTICARRIER MODULATION; NUMERICAL METHODS; SIGNAL ANALYSIS; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS; TESTING;

SIGNAL PROCESSING;

EID: 72049106908     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2009.10.006     Document Type: Article

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