Testing of precision DACs using low-resolution ADCs with dithering

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Jin, Le ^a   Haggag, Hosam ^b   Geiger, Randall ^a   Chen, Degang ^a  

^a Iowa State University   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; HIGH SPEED NETWORKS; MICROPROCESSOR CHIPS; OPTICAL RESOLVING POWER; SOFTWARE TESTING;

CLOCK RATES; HIGH SPEED DATA; MEASUREMENT DEVICES; ON-CHIP TESTING;

ANALOG TO DIGITAL CONVERSION;

EID: 39749117467     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297628     Document Type: Conference Paper

References (11)