메뉴 건너뛰기




Volumn 19, Issue 1, 2010, Pages 7-14

Pulsed laser deposition of hard and superhard carbon thin films from C60 targets

Author keywords

Characterization; Diamond like carbon; Films; Fullerenes; Hardness; Pulsed laser deposition; Superhard materials

Indexed keywords

CARBON THIN FILMS; DEPOSITION TEMPERATURES; DIAMOND-LIKE CARBON; DIAMOND-LIKE FILM; DIFFERENT SUBSTRATES; ENERGY DISPERSIVE X-RAY DIFFRACTIONS; FREQUENCY-DOUBLED ND:YAG LASER; HARD FILMS; MORPHOLOGY AND MECHANICAL PROPERTIES; PULSE DURATIONS; PULSED LASER; SCANNING ELECTRONS; SI(111) SUBSTRATE; SUBSTRATE TEMPERATURE; SUPERHARD; SUPERHARD MATERIAL; VICKERS MICROHARDNESS; X-RAY PHOTOELECTRONS;

EID: 72049090377     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2009.10.010     Document Type: Article
Times cited : (28)

References (45)
  • 20
    • 72049105615 scopus 로고    scopus 로고
    • Technique for diffraction e reflection measurements of solid and liquid samples,
    • Italian Patent No. RM 93 A 000410, 1993
    • R. Felici, F. Cilloco, R. Caminiti, C. Sadun, V. Rossi, Technique for diffraction e reflection measurements of solid and liquid samples, Italian Patent No. RM 93 A 000410, 1993.
    • Felici, R.1    Cilloco, F.2    Caminiti, R.3    Sadun, C.4    Rossi, V.5
  • 40
    • 72049123786 scopus 로고    scopus 로고
    • International Centre for Diffraction Data
    • International Centre for Diffraction Data, Database JCPDS 2000.
    • (2000) Database JCPDS


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.