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Volumn 32, Issue 13, 1999, Pages 1443-1446

Enhanced field emission current from diamond-like carbon films deposited by laser ablation of C60 fullerene

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; ELECTRIC FIELDS; ELECTRON ENERGY LEVELS; FERMI LEVEL; FILMS; FULLERENES; HYDROCARBONS; LASER ABLATION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACES;

EID: 0032624476     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/13/302     Document Type: Article
Times cited : (10)

References (28)
  • 10


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.