Influence of reactor neutrons irradiation on electrical, optical and structural properties of SnO2 film prepared by sol-gel method

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 611, Issue 1, 2009, Pages 14-17

  Izerrouken, M ^a   Kermadi, S ^b   Souami, N ^a   Sari, A ^c   Boumaour, M ^b  

^a CENTRE DE RECHERCHE NUCLÉAIRE D ALGER   (Algeria)

^b L'Unite de Developpement de la Technologie du Silicium   (Algeria)

^c NUCLEAR RESEARCH CENTRE OF BIRINE   (Algeria)

Author keywords

Electrical properties; Optical properties; Radiation damage; Reactor neutrons; Semiconductors

Indexed keywords

ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ENERGY GAP; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; RADIATION DAMAGE; SEMICONDUCTOR MATERIALS; SOL-GEL PROCESS; SOL-GELS; X RAY DIFFRACTION;

CRYSTALLINITIES; ELECTRICAL , OPTICAL AND STRUCTURAL PROPERTIES; ELECTRICAL MEASUREMENT; FAST NEUTRONS; INDUCED DEFECTS; OPTICAL MEASUREMENT; REACTOR NEUTRONS; STRUCTURAL MEASUREMENTS;

NEUTRON IRRADIATION;

EID: 71849117676     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.09.003     Document Type: Article

References (30)

1. Barbarat Ph., Matar S.F., and Le Blevenne G. J. Mater. Chem. 7 12 (1997) 2547
2. Wang Y., Ma J., Ji F., Yu X., and Ma H. J. Lumin. 114 (2005) 71
3. Kim T.W., Lee D.U., and Yoon Y.S. J. Appl. Phys. 88 (2000) 3759
4. Bauer T., Kolb J.S., Loffler T., Mohler E., Roskos H.G., and Pernisz U.C. J. Appl. Phys. 92 (2002) 2210
5. Gu F., Wang S.F., Song C.F., Lu M.K., Qi Y.X., Zhou G.J., Xu D., and Yuan D.R. Chem. Phys. Lett. 372 (2003) 451
6. Yuan Z., Li D., Wang M., Chen P., Gong D., Cheng P., and Yang D. App. Phys. Lett. 92 (2008) 121908
7. Wu X., Liu X., and Xu S. Solid State Commun. 148 (2008) 491
8. Batzill M., and Diebold U. Prog. Surf. Sci. 79 (2005) 47
9. Kilic C., and Zunger A. Phys. Rev. Lett. 88 (2002) 5501
10. Prades J.D., Ardiol J., Cirera A., Morante J.R., Avella M., Zanotti L., Comini E., Faglia G., and Sberveglieri G. Sensors. Actuators B 126 (2007) 6
11. Merdrignac O.M., Moseley P.T., Peat R., Sofield C.J., and Sugden S. Sensors. Actuators B 7 (1988) 651
12. Mohanty T., Satyam P.V., and Kanjilal D. J. Nanosci. Nanotechnol. 6 (2006) 1
13. Rani S., Bhatnagar M.C., Roy S.C., Puri N.K., and Kanjilal D. Sensors. Actuators B 135 (2008) 35
14. Rani S., Bhatnagar M.C., Roy S.C., Puri N.K., and Kanjilal D. Nucl. Instr. Phys. Res. B 266 (2008) 1987
15. Terrier C., Chatelon J.P., and Roger J.A. Thin Solid Films 295 (1997) 95
16. Johansson J., Tiainen O.J.A., and Valkiainen M. Radiat. Eff. 31 (1977) 149
17. Borchi M., Bertrand C., Leroy C., Bruzzi M., Furetta C., Paludetto R., Rancoita P.G., Vismara L., and Giuhellino P. Nucl. Instr. and Meth. A 279 (1988) 277
18. Bosetti M., Croitoru N., Furetta C., Leroy C., Pensotti S., Rancoita P., Rattaggi M., Redaelli M., and Seidman A. Nucl. Instr. Phys. Res. B 95 (1995) 219
19. Croitoru N., Dahan R., Rancoita P.G., Rattaggi M., Rossi G., and Seidman A. Nucl. Instr. Phys. Res. B 124 (1997) 542
20. Wertz J.E., Orton J.W., and Auzins P. Discuss. Faraday Soc. 31 (1961) 140
21. Frake P., Greenhalgh D., Grierson S.M., Hempenstall J.M., and Rudd D.R. Int. J. Pharm. 151 (1997) 75
22. Davis E.A., and Mott N.F. Philos. Mag. 22 (1970) 903
23. Ka M.S., Kaur G., Thangaraj R., and Avasthi D.K. J. Phys. D: Appl. Phys. 35 (2002) 477
24. Sharma P., Vashistha M., and Jain I.P. Opt. Mater. 27 (2004) 395
25. Ahire R.R., Sagade A.A., Chavhan S.D.C., Huse V., Gudage Y.G., Singh F., Avasthi D.K., Phase D.M., and Sharma R. Curr. Appl. Phys. 9 (2009) 373
26. Gillet M., Lemire C., Gillet E., and Aguir K. Surf. Sci. 532-535 (2003)
27. Boccanfuso M., Benyagoub A., Toulemonde M., Trautmann C., Schwartz K., and Dufour C.H. Nucl. Instr. Phys. Res. B 175-177 (2001) 590
28. Hemon S., Gourbilleau F., Dufour Ch., Paumier E., Dooryhee E., and Rouanet A. Nucl. Instr. Phys. Res. B 122 (1997) 526
29. Berthelot A., Hemon S., Gourbilleau F., Dufour Ch., Dooryhee E., and Paumier E. Nucl. Instr. Phys. Res. B 146 (1998) 437
30. Berthelot A., Hemon S., Gourbilleau F., Dufour Ch., Domenges B., and Paumier E. Phil. Mag. A 80 (2000) 2567