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Volumn 27, Issue 3, 2004, Pages 395-398
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Optical study of ion-induced effects in Ge20Se 80-xBix thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION;
DIFFERENTIAL SCANNING CALORIMETRY;
EVAPORATION;
HEAVY IONS;
SAMPLING;
THIN FILMS;
X RAY DIFFRACTION;
BAND GAP;
FLASH EVAPORATION;
ION-INDUCED EFFECTS;
NON-EQUILIBRIUM PROCESS;
GERMANIUM COMPOUNDS;
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EID: 9544242745
PISSN: 09253467
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optmat.2004.09.006 Document Type: Article |
Times cited : (25)
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References (20)
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