Study of resistivity and majority carrier concentration of silicon detectors damaged by neutron irradiation up to 1016 n/cm2

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 124, Issue 4, 1997, Pages 542-548

  Croitoru, N ^a,b   Dahan, R ^b   Rancoita, P G ^a   Rattaggi, M ^a   Rossi, G ^a   Seidman, A ^a,b  

^a INFN SEZIONE DI MILANO   (Italy)

^b TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; HALL EFFECT; IRRADIATION; NEUTRON IRRADIATION; NEUTRONS; SILICON; SINGLE CRYSTALS;

HALL EFFECT MEASUREMENT; SILICON DETECTORS;

RADIATION DETECTORS;

EID: 0031146654     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00055-4     Document Type: Article

References (23)

1. M. Borchi, C. Bertrand, C. Leroy, M. Bruzzi, C. Furetta, R. Paludetto, P.G. Rancoita, L. Vismara and P. Giubellino, Nucl. Instr. and Meth. A 279 (1988) 277.
2. H.W. Kraner, Z. Li and K.V. Posnecker, Nucl. Instr. and Meth. A 279 (1983) 266.
3. E. Fretwurst, H. Herdan, G. Lindström, U. Pein, M. Rollwagen, H. Schatz, P. Thomson and R. Wunstorf, Nucl. Instr. and Meth. A 288 (1990) 1.
4. M. Bosetti, N. Croitoru, C. Furetta, S. Pensotti, P. Rancoita, M. Rattagi, M. Redaelli and A. Seidman, Nucl. Instr. and Meth. B 95 (1995) 21.
5. Z. Li and H.W. Kraner, Nucl. Instr. and Meth. A 308 (1991) 585.
6. M. Bosetti et. al., Nucl. Instr. and Meth. A 343 (1994) 435.
7. Z. Li, Nucl. Instr. and Meth. A 342 (1994) 105.
8. Z. Li, in: Italian Phys. Soc. Conf. Proc., Vol. 46, eds. A. Baldial and E. Focardi (SIF, Bologna, 1994) p. 1730.
9. F. Lemeilleur, M. Glaser, E.H.M. Heijne, P. Jarron, C. Soares, C. Leroy, J. Rioux and I. Trigger, IEEE Trans. Nucl. Sci. 41 (1994) 426.
10. Z. Li and H.W. Kraner, IEEE Trans. Nucl. Sci. 38 (1991) 244.
11. R. Wunstorf, M. Benkert, N. Claussen, N. Croitoru, E. Fretwurst, G. Lindström and T. Schulz, Nucl. Instr. and Meth. A 315 (1992) 149.
12. M. Bruzzi, E. Borchi and A. Baldini, J. Appl. Phys. 72 (9) (1992) 4007.
13. G. Lindström, M. Benkert, E. Fretwurst, T. Schultz and R. Wunstorf, in: Proc. 1st Int. Conf. on Calorimetry in High Energy Physics, eds. D.F. Anderson et al. (World Scientific, Singapore, 1991).
14. U. Biggeri, E. Borchi, M. Bruzzi and S. Lazanu, Nucl. Instr. and Meth. A 360 (1995) 131.
15. I. Tsveybak, W. Bugg, J.A. Harvey and J. Walter, IEEE Trans. Nucl. Sci. 39 (1990) 1720.
16. N. Croitoru, A. Gambirasio, P.G. Rancoita and A. Seidman, Nucl. Instr. and Meth. B 111 (1996) 297.
17. W.R. Runian, Semiconductor Measurements and Instrumentation (McGraw-Hill, Kogakushi, 1975) p. 134.
18. S.M. Sze, Physics Semiconductor Devices (Wiley, New York, 1981) p. 29.
19. W.E. Spear and P.G. LeComber, Phil. Mag. 33 (1976) 935.
20. M. Levalois, P. Bogdanski and M. Toulemonde, Nucl. Instr. and Meth. B 63 (1992) 14.
21. B.R. Gossik, J. Appl. Phys. 30 (1959) 1214.
22. H.J. Jurechke, J. Appl. Phys. 27 (1956) 838.
23. V. Eremin and Z. Li, Nucl. Instr. and Meth. A 362 (1995) 338.