In-situ observation of the microstructural evolution in germanium under the low-energy helium ion irradiation

Journal of Electron Microscopy

Volumn 48, Issue 4, 1999, Pages 399-405

  Arakawa, Kazuto ^a   Tsukamoto, Tetsuo ^b   Tadakuma, Kentaroh ^a   Yasuda, Kohjiroh ^a   Ono, Kotaro ^a  

^a SHIMANE UNIVERSITY   (Japan)

^b Origin Electric Co Ltd   (Japan)

Author keywords

Electron microscopy; Germanium; Helium; Ion irradiation; Lattice defect; Radiation effect

Indexed keywords

ELECTRON IRRADIATION; ELECTRONS; GERMANIUM; IONS; MICROSTRUCTURE; RADIATION EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

DEFECT CLUSTERING; GERMANIUMS (GE); HELIUM ATOM; HELIUM ION; IN-SITU OBSERVATIONS; INTERSTITIAL TYPE DEFECTS; ION ACCELERATOR; IONS IRRADIATION; LOW ENERGY HELIUM; TRANSMISSION ELECTRON;

ION BOMBARDMENT;

EID: 0032831662     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023695     Document Type: Article

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