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Volumn , Issue , 2009, Pages 45-49

Fine grain thermal modeling of 3D stacked structures

Author keywords

3D stacked ICs; Design layout; Thermal aware design; Thermal modeling

Indexed keywords

3D INTERCONNECT; 3D STACKING; BACK END OF LINES; BGA PACKAGE; DESIGN LAYOUT; ELECTRICAL DESIGN; ELECTRONIC SYSTEMS; FINE GRAINS; KEY TECHNOLOGIES; MULTILAYER INTERCONNECTIONS; NUMERICAL TECHNIQUES; PERFORMANCE ENHANCEMENTS; STACKED DIE; STACKED DIE PACKAGES; STACKED STRUCTURE; THERMAL ANALYSIS; THERMAL MODELING; THERMAL SPREADING; THERMAL-AWARE DESIGN;

EID: 71749118577     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (14)
  • 1
    • 71749084830 scopus 로고    scopus 로고
    • The International technology Roadmap for semiconductors (ITRS), 2008 edition. URL: http://www.itrs.net/Links/2008ITRS/Home2008.htm
    • The International technology Roadmap for semiconductors (ITRS), 2008 edition. URL: http://www.itrs.net/Links/2008ITRS/Home2008.htm
  • 4
    • 71749119181 scopus 로고    scopus 로고
    • [4 ] FireBolt (Nanoscale Full-Chip Thermal Simulator), Gradient Design Automation, Inc, http://www.gradient-da.com/
    • [4 ] FireBolt (Nanoscale Full-Chip Thermal Simulator), Gradient Design Automation, Inc, http://www.gradient-da.com/
  • 6
    • 2342646748 scopus 로고    scopus 로고
    • Structure function evaluation of stacked dies
    • March 9-11, San Jose, CA, USA, pp
    • M. Rencz, V. Székely: Structure function evaluation of stacked dies, Proceedings of the XXth SEMI-THERM Symposium, March 9-11, San Jose, CA, USA, pp 50-55, 2004.
    • (2004) Proceedings of the XXth SEMI-THERM Symposium , pp. 50-55
    • Rencz, M.1    Székely, V.2
  • 7
    • 0037272189 scopus 로고    scopus 로고
    • Compact Modeling Approaches to Multiple Die Stacked Chip Scale Packages.
    • Enrico A. Garcia, Chia-Pin Chiu: Compact Modeling Approaches to Multiple Die Stacked Chip Scale Packages. , 19th IEEE SEMI-THERM Symposium, pp. 160-167, 2003.
    • (2003) 19th IEEE SEMI-THERM Symposium , pp. 160-167
    • Enrico, A.1    Garcia2    Pin Chiu, C.3
  • 13
    • 46049098824 scopus 로고    scopus 로고
    • 3D Integration by Cu-Cu Thermo-Compression Bonding of Extremely Thinned Bulk-Si Die Containing 10 μm Pitch Through-Si Vias
    • December
    • B. Swinnen et al., "3D Integration by Cu-Cu Thermo-Compression Bonding of Extremely Thinned Bulk-Si Die Containing 10 μm Pitch Through-Si Vias", Int. Electron Devices Meeting, pp. 1-4, December 2006.
    • (2006) Int. Electron Devices Meeting , pp. 1-4
    • Swinnen, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.