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Volumn , Issue , 2009, Pages

Junction-level thermal extraction and simulation of 3DICs

Author keywords

[No Author keywords available]

Indexed keywords

3-D INTEGRATION; 3D THERMAL ANALYSIS; ACTIVE DEVICES; CLOCK BUFFER; FFT PROCESSORS; HEAT DENSITY; SPATIAL RESOLUTION; THERMAL EXTRACTION; THERMAL PATHS;

EID: 70549092974     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/3DIC.2009.5306529     Document Type: Conference Paper
Times cited : (19)

References (14)
  • 1
    • 0036508274 scopus 로고    scopus 로고
    • Power-constrained CMOS scaling limits
    • Mar/May
    • D. J. Frank, "Power-constrained CMOS scaling limits", IBM J. Res. & Dev., Vol. 46, No. 2/3, pp. 235-244, Mar/May 2002
    • (2002) IBM J. Res. & Dev , vol.46 , Issue.2-3 , pp. 235-244
    • Frank, D.J.1
  • 2
    • 0032139246 scopus 로고    scopus 로고
    • ILLIADS-T: An Electrothermal Timing Simulator for Temperature Sensitive Reliability Diagnosis of CMOS VLSI Chips
    • Aug
    • Y. Cheng, P. Raha, C.C. Teng, E. Rosenbaum and S.M. Kang, "ILLIADS-T: An Electrothermal Timing Simulator for Temperature Sensitive Reliability Diagnosis of CMOS VLSI Chips", Comp. Aided Design of Circuits and Systems, Vol 17., No 8, Aug 1998
    • (1998) Comp. Aided Design of Circuits and Systems , vol.17 , Issue.8
    • Cheng, Y.1    Raha, P.2    Teng, C.C.3    Rosenbaum, E.4    Kang, S.M.5
  • 4
    • 0347409236 scopus 로고    scopus 로고
    • Efficient thermal placement of standard cells in 3D ICs using a force directed approach
    • B. Goplen and S. Sapatnekar, "Efficient thermal placement of standard cells in 3D ICs using a force directed approach", International Conference on Computer Aided Design, pp 86-89, 2003.
    • (2003) International Conference on Computer Aided Design , pp. 86-89
    • Goplen, B.1    Sapatnekar, S.2
  • 7
    • 0014630193 scopus 로고
    • Electromigration Failure Modes in Aluminium Metallization for Semiconductor Devices
    • Sep
    • J. R. Black, "Electromigration Failure Modes in Aluminium Metallization for Semiconductor Devices", Proc. IEEE, Vol. 57, No. 9, pp. 1587-1594, Sep. 1969.
    • (1969) Proc. IEEE , vol.57 , Issue.9 , pp. 1587-1594
    • Black, J.R.1
  • 8
    • 84937650904 scopus 로고
    • Electromigration - A brief survey and some recent results
    • April
    • J. R. Black, "Electromigration - A brief survey and some recent results", IEEE T. Electron Devices, Vol 16, Issue 4, pp 338 - 347, April 1969
    • (1969) IEEE T. Electron Devices , vol.16 , Issue.4 , pp. 338-347
    • Black, J.R.1
  • 9
    • 84861418911 scopus 로고    scopus 로고
    • Fast Computation of the Temperature Distribution in VLSI chips using the Discrete Cosine Transform and Table Lookup
    • Jan
    • Y. Zhan and S. S. Sapatnekar "Fast Computation of the Temperature Distribution in VLSI chips using the Discrete Cosine Transform and Table Lookup", ASPDAC, Jan 2005
    • (2005) ASPDAC
    • Zhan, Y.1    Sapatnekar, S.S.2
  • 10
    • 33846609148 scopus 로고    scopus 로고
    • Accelerated Chip-Level Thermal Analysis Using Multilayer Green's Function
    • Feb
    • B. Wang and P. Mazumder, "Accelerated Chip-Level Thermal Analysis Using Multilayer Green's Function", IEEE T. Comp. Aided Design of Circuits and Systems, Vol 26., No 2, pp325-344 Feb 2007
    • (2007) IEEE T. Comp. Aided Design of Circuits and Systems , vol.26 , Issue.2 , pp. 325-344
    • Wang, B.1    Mazumder, P.2
  • 11
    • 34548127962 scopus 로고    scopus 로고
    • 3DFFT: Thermal Analysis of Non-Homogeneous IC using 3D FFT Green Function Method
    • D. Oh, C. C. P. Chen and Y. H. Hu, "3DFFT: Thermal Analysis of Non-Homogeneous IC using 3D FFT Green Function Method", 8th Int. Symp. Quality Elect. Design, 2007
    • (2007) 8th Int. Symp. Quality Elect. Design
    • Oh, D.1    Chen, C.C.P.2    Hu, Y.H.3
  • 14
    • 70549096034 scopus 로고    scopus 로고
    • MIT Lincoln Laborary Low-Power FDSOI CMOS Process Design Guide, September 2008.
    • MIT Lincoln Laborary Low-Power FDSOI CMOS Process Design Guide, September 2008.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.