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Volumn 610, Issue 1, 2009, Pages 311-313
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Optoelectronic performance of GaN-based UV photodetectors
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Author keywords
GaN photodetector; Schottky diode
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Indexed keywords
BARRIER LOWERING;
CARRIER TRAPPING;
CHOPPING FREQUENCY;
DEFECTS AND IMPURITIES;
DISPERSIVE BEHAVIORS;
EXPONENTIAL INCREASE;
GAN FILM;
OPTOELECTRONIC CHARACTERISTICS;
PHOTOEFFECT;
RESPONSIVITY;
SAPPHIRE SUBSTRATES;
SCHOTTKY DIODE;
SCHOTTKY DIODES;
SPACE CHARGE REGIONS;
STRUCTURAL DEFECT;
UV PHOTODETECTORS;
WORKING FREQUENCY;
YIELD MEASUREMENT;
CHARGE TRAPPING;
CORUNDUM;
DIODES;
GALLIUM NITRIDE;
OPTOELECTRONIC DEVICES;
PHOTOCURRENTS;
PHOTODETECTORS;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING GALLIUM;
GALLIUM ALLOYS;
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EID: 71749084868
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2009.05.095 Document Type: Article |
Times cited : (9)
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References (11)
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