Pulsed multi-tone measurements for time domain load pull characterizations of power transistors

73rd ARFTG Microwave Measurement Conference Spring 2009 - Practical Applications of Nonlinear Measurements

Volumn , Issue , 2009, Pages

  De Groote, Fabien ^a,b   Roblin, Patrick ^a   Ko, Young Seo ^a   Yang, Chieh Kai ^a   Doo, Seok Joo ^a   Vanden Bossche, Marc ^c   Teyssier, Jean Pierre ^b,d  

^a OHIO STATE UNIVERSITY   (United States)

^b Verspecht Teyssier DeGroote SAS   (France)

^c NMDG   (Belgium)

^d IUT GEII   (France)

Author keywords

Modulation; Power amplifiers; Pulsed measurements; Real time active load pull; Time domain measurements; Transistor

Indexed keywords

ACTIVE LOAD; MODULATION POWER; PULSED MEASUREMENTS; REAL TIME; TIME DOMAIN MEASUREMENT; TIME DOMAIN MEASUREMENTS;

CHARACTERIZATION; ELECTRIC LOADS; ELECTRIC NETWORK ANALYSIS; HETEROJUNCTION BIPOLAR TRANSISTORS; MICROWAVE MEASUREMENT; MICROWAVES; MODULATION; POWER AMPLIFIERS; POWER ELECTRONICS; RADAR SYSTEMS; TIME DOMAIN ANALYSIS; TRANSISTORS;

MEASUREMENTS;

EID: 71249154337     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2009.5278072     Document Type: Conference Paper

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