Large-Signal Time Domain Characterization of Microwave Transistors under RF Pulsed Conditions

57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001

Volumn , Issue , 2001, Pages

  Teyssier, J P ^a   Augaudy, S ^a   Barataud, D ^a   Nebus J M ^a   Quere R ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE DEVICES;

HARMONIC FREQUENCY; LARGE-SIGNALS; MICROWAVE TRANSISTORS; NETWORK MEASUREMENT SYSTEMS; PULSED CONDITIONS; RF MEASUREMENTS; TIME DOMAIN; TIME DOMAIN MEASUREMENT;

TIME DOMAIN ANALYSIS;

EID: 84962361655     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2001.327460     Document Type: Conference Paper

References (7)

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