Extended NVNA bandwidth for long-term memory measurements

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2004, Pages 1739-1742

  Remley, Kate A ^a   Schreurs, Dominique M M P ^b   Williams, Dylan F ^a   Wood, John ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c AGILENT TECHNOLOGIES   (United States)

Author keywords

Intermodulation distortion; Long term memory; Nonlinear vector network analyzer

Indexed keywords

HIGH ELECTRON MOBILITY TRANSISTORS (HEMT); INTERMODULATION DISTORTION; LONG TERM MEMORY; NONLINEAR VECTOR NETWORK ANALYZERS;

BANDWIDTH; DISTORTION (WAVES); ELECTRIC NETWORK ANALYSIS; ELECTRON MOBILITY; FREQUENCY RESPONSE; HARMONIC ANALYSIS; INTERMODULATION; MICROWAVE CIRCUITS;

PHASE MODULATION;

EID: 4544266089     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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