Nanoscale fine-structure evaluation of RF magnetron sputtered anatase films using HRTEM, AFM, micro-Raman spectroscopy and fractal analysis

Surface and Coatings Technology

Volumn 204, Issue 9-10, 2010, Pages 1366-1374

  Abdul Khadar, M ^a   Mohemmed Shanid, N A ^a  

^a UNIVERSITY OF KERALA   (India)

Author keywords

AFM; Fractal analysis; HRTEM; Nanostructures; Quantum confinement effect; Titanium dioxide

Indexed keywords

AFM; ANATASE FILMS; ANATASE PHASE; ANNEALED FILMS; AS-DEPOSITED FILMS; ATOMIC FORCE; BAND TAILING; BAND-GAP VALUES; CRYSTALLINE FILMS; CRYSTALLINE PERFECTION; DEEP VALLEY; DEGREE OF ORIENTATION; DYE SENSITIZED SOLAR CELL; FINE STRUCTURES; FRACTAL ANALYSIS; GRAIN SIZE; GRAZING INCIDENCE X-RAY DIFFRACTION ANALYSIS; HIGH MOUNTAINS; HIGH TEMPERATURE; HIGHER TEMPERATURES; HRTEM ANALYSIS; MICRO RAMAN SPECTROSCOPY; MORPHOLOGICAL FEATURES; NANO SCALE; NANOCRYSTALLINE TITANIUM DIOXIDE; NANOSTRUCTURED TIO; OXIDE MATERIALS; PARTICLE CONTACTS; QUANTUM CONFINEMENT EFFECTS; RADIO FREQUENCY MAGNETRON SPUTTERING; RAMAN SPECTRA; RF MAGNETRONS; ROUGH SURFACES; THEORY OF FRACTALS; THERMAL TREATMENT; TIO; UV-VISIBLE;

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; ENERGY CONVERSION; ENERGY GAP; FRACTALS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LANDFORMS; MAGNETRONS; NANOSTRUCTURES; OXIDES; PHOTOCATALYSIS; QUANTUM CONFINEMENT; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SINGLE CRYSTALS; TITANIUM; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS FILMS;

EID: 71049159948     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2009.09.023     Document Type: Article

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