Infrared response of vitreous titanium dioxide films with anatase short-range order

Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 1118-1128

  Scarel, G ^a   Hirschmugl, C J ^b   Yakovlev, V V ^b   Sorbello, R S ^b   Aita, C R ^b   Tanaka, H ^a   Hisano, K ^c  

^a University of Wisconsin Milwaukee   (United States)

^b UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

^c NATIONAL DEFENSE ACADEMY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANATASE CRYSTALS; BAND FREQUENCIES; DIELECTRIC FUNCTIONS; ENERGY LOSS FUNCTION; INFRARED REFLECTION ABSORPTION SPECTROSCOPY; INFRARED RESPONSE; LONGITUDINAL OPTICS; LOSS FUNCTIONS; NEAREST-NEIGHBORS; OPTICAL RESPONSE; ORIENTATIONAL DISORDER; REFLECTION-ABSORPTION; RELATIVE INTENSITY; SHORT RANGE ORDERS; TIO; TITANIUM DIOXIDE FILMS; TRANSVERSE OPTICS;

CRYSTAL ORIENTATION; ENERGY DISSIPATION; OXIDES; POLARIZATION;

TITANIUM DIOXIDE;

EID: 0036470058     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1427430     Document Type: Article

References (62)

1. T. Nakayama, K. Onisawa, M. Fuyama, and M. Hanasono, J. Electrochem. Soc. 139, 1204 (1992). jes JESOAN 0013-4651
2. K. Jurek, M. Guglielni, G. Kuncova, O. Renner, F. Lukes, M. Navratil, E. Rousky, V. Vorlicek, and K. Kokesova, J. Mater. Sci. 27, 2549 (1992). jmt JMTSAS 0022-2461
3. K. S. Yeung and Y. W. Lam, Thin Solid Films 109, 169 (1983). tsf THSFAP 0040-6090
4. B.-H. Jun et al., Appl. Opt. 36, 1482 (1997). apo APOPAI 0003-6935
5. E. Sirbegovic, M. Cevro, and I. Tucak, Vacuum 43, 723 (1992). vac VACUAV 0042-207X
6. J. D. DeLoach and C. R. Aita, J. Mater. Sci. Lett. 19, 1123 (2000). jml JMSLD5 0261-8028
7. W. L. Bragg, Atomic Structure of Minerals (Cornell University Press, Ithaca, 1937), pp. 102-106.
8. J. G. Clark, The Chemistry of Titanium and Vanadium (Elsevier, New York, 1968), pp. 66-277.
9. F. Dachille, P. Y. Simons, and R. Roy, Am. Mineral. 53, 1929 (1968). amn AMMIAY 0003-004X
10. S.-D. Mo and W. Y. Ching, Phys. Rev. B 51, 13023 (1995). prb PRBMDO 0163-1829
11. K. Kosuge, Chemistry of Non-stoichiometric Compounds (Oxford University Press, Oxford, UK, 1994), pp. 121-128.
12. F. P. Felner, Low Temperature Oxidation (Wiley-Interscience, New York, 1981), pp. 31-49 and references therein.
13. M. Shiojiri, J. Phys. Soc. Jpn. 21, 335 (1966). jup JUPSAU 0031-9015
14. T. M. Salama, T. Tanaka, T. Yamaguchi, and K. Tanabe, Surf. Sci. Lett. 227, L100 (1990). ssl SUSCAS 0167-2584
15. W. G. Lee, S. I. Woo, J. C. Kim, S. H. Choi, and K. H. Oh, Thin Solid Films 237, 105 (1994). tsf THSFAP 0040-6090
16. D. G. Howitt and A. B. Harker, J. Mater. Sci. 2, 201 (1987). jmt JMTSAS 0022-2461
17. L. S. Hsu, R. Rujkorakarn, J. R. Sites, and C. Y. She, J. Appl. Phys. 59, 3475 (1986). jap JAPIAU 0021-8979
18. T. Nakayama, J. Electrochem. Soc. 141, 237 (1994). jes JESOAN 0013-4651
19. R.-Y. Tasi and M.-Y. Hua, Appl. Opt. 35, 5073 (1996). apo APOPAI 0003-6935
20. H. Nozoye and N. Nishimiya, Appl. Phys. Lett. 54, 231 (1989). apl APPLAB 0003-6951
21. J. D. DeLoach and C. R. Aita, J. Vac. Sci. Technol. A 16, 1963 (1998). jva JVTAD6 0734-2101
22. M. D. Wiggins, M. C. Nelson, and C. R. Aita, J. Vac. Sci. Technol. A 14, 772 (1996); jva JVTAD6 0734-2101
23. Proc. Mat. Res. Soc. 398, 381 (1996).
24. P. Alexandrov, J. Koprinarova, and D. Todorov, Vacuum 47, 1333 (1996). vac VACUAV 0042-207X
25. D. Wicaksana, A. Kobayashi, and A. Kinbara, J. Vac. Sci. Technol. A 10, 1479 (1992). jva JVTAD6 0734-2101
26. D. Guerin and S. Ismat Shah, J. Vac. Sci. Technol. A 15, 712 (1997). jva JVTAD6 0734-2101
27. M. G. Krishna, N. Rao, and S. Mohan, J. Appl. Phys. 73, 434 (1993). jap JAPIAU 0021-8979
28. L. M. Williams and D. W. Hess, J. Vac. Sci. Technol. A 1, 1810 (1983). jva JVTAD6 0734-2101
29. N. Martin, C. Rousselot, D. Rondot, F. Palmiro, and R. Mercier, Thin Solid Films 3000, 113 (1997). tsf THSFAP 0040-6090
30. J. D. DeLoach, G. Scarel, and C. R. Aita, J. Appl. Phys. 85, 2377 (1999). jap JAPIAU 0021-8979
31. J. A. Eastman, J. Appl. Phys. 75, 770 (1994). jap JAPIAU 0021-8979
32. V. V. Yakovlev, G. Scarel, C. R. Aita, and S. Mochizuki, Appl. Phys. Lett. 76, 1107 (2000). apl APPLAB 0003-6951
33. J. Tauc, in Amorphous and Liquid Semiconductors, edited by J. Tauc (Plenum, London, 1974), Chap. 4.
34. P. M. A. Sherwood, Vibrational Spectroscopy Of Solids (Cambridge University Press, Cambridge, UK, 1972).
35. D. W. Berreman, Phys. Rev. 130, 2193 (1963). phr PHRVAO 0031-899X
36. F. L. Galeener and G. Lucovsky, Phys. Rev. Lett. 37, 1474 (1976). prl PRLTAO 0031-9007
37. F. L. Galeener, A. J. Leadbetter, and M. W. Stringfellow, Phys. Rev. B 27, 1052 (1983). prb PRBMDO 0163-1829
38. S. E. de Leeuw and M. F. Thorpe, Phys. Rev. Lett. 55, 2879 (1985). prl PRLTAO 0031-9007
39. M. F. Thorpe and S. E. de Leeuw, Phys. Rev. B 33, 8490 (1986). prb PRBMDO 0163-1829
40. J. M. Gales, B. Boltjes, M. F. Thorpe, and S. E. de Leeuw, Phys. Rev. B 40, 7214 (1989). prb PRBMDO 0163-1829
41. R. M. Almeida, Phys. Rev. B 45, 161 (1992). prb PRBMDO 0163-1829
42. E. I. Kamitsos, A. P. Patsis, and G. Kordas, Phys. Rev. B 48, 12499 (1993). prb PRBMDO 0163-1829
43. M. A. Ovchinnikov and C. A. Wight, J. Chem. Phys. 99, 3374 (1993); jcp JCPSA6 0021-9606
44. 100, 972 (1994); jcp JCPSA6 0021-9606
45. 102, 67 (1995). jcp JCPSA6 0021-9606
46. R. J. Gonzalez, R. Zallen, and H. Berger, Phys. Rev. B 55, 7014 (1997). prb PRBMDO 0163-1829
47. See for example: H. P. Klug and L. E. Alexander, X-Ray Diffraction Processes (Wiley, New York, 1974).
48. W. N. Hansen, J. Opt. Soc. Am. 58, 380 (1968). jox JOSAAH 0030-3941
49. Anatase: ASTM JCPDS File No. 21-1272 (1991).
50. Rutile: ASTM JCPDS File No. 21-1276 (1991).
51. B. L. Averbach and M. Cohen, Trans. AIME 176, 401 (1948). tak TAIMAF 0096-4778
52. L. S. Zevin and G. Kimmel, Quantitative X-ray Diffractometry (Springer, New York, 1995), pp. 188-204.
53. M. Ocana, J. V. Garcia-Ramos, and C. J. Serna, J. Am. Ceram. Soc. 75, 2010 (1992). jac JACTAW 0002-7820
54. B. C. Trasferetti, C. U. Davanzo, N. C. da Cruz, and M. A. B. de Moraes, Appl. Spectrosc. 54, 687 (2000). aps APSPA4 0003-7028
55. D. M. Eagles, J. Phys. Chem. Solids 25, 1243 (1964). jpx JPCSAW 0022-3697
56. A. Aoki, H. Tanaka, and K. Hisano, Proceedings of the Twelfth Japan Symposium on Thermophysical Properties, A103 (1991), p. 9.
57. N. W. Ashcroft and N. D. Mermin, Solid State Physics (Saunders College Press, Philadelphia, 1976).
58. R. Fuchs, K. L. Kliewer, and W. J. Pardee, Phys. Rev. 150, 589 (1966). phr PHRVAO 0031-899X
59. R. G. Greenler, J. Chem. Phys. 44, 310 (1966). jcp JCPSA6 0021-9606
60. R. Landauer, in Electrical Transport and Optical Properties of Inhomogeous Media edited by J. C. Garland and D. B. Tanner (American Institute of Physics, New York, 1978), p. 2.
61. R. W. Cohen, G. D. Cody, M. D. Coutts, and B. Abeles, Phys. Rev. B 8, 3689 (1973). prq PLRBAQ 0556-2805
62. D. Stroud, Phys. Rev. B 12, 3368 (1975). prq PLRBAQ 0556-2805