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Volumn 81, Issue 20, 2009, Pages 8577-8584

Inkjet metrology: High-accuracy mass measurements of microdroplets produced by a drop-on-demand dispenser

Author keywords

[No Author keywords available]

Indexed keywords

COMBINED UNCERTAINTY; DROP-ON-DEMAND; DROPLET MASS; DROPLET SIZES; GRAVIMETRIC METHODS; HIGH SPEED VIDEOGRAPHY; HIGH-ACCURACY; ISOBUTYL ALCOHOLS; LIMIT OF QUANTITATIONS; LIMITS OF QUANTITATIONS; MASS MEASUREMENTS; MICRO DROPLETS; MICRO-DISPENSER; OPERATIONAL FACTORS; STANDARD MATERIALS; STANDARD UNCERTAINTY;

EID: 70449955455     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac901563j     Document Type: Article
Times cited : (99)

References (53)
  • 41
    • 84983309160 scopus 로고    scopus 로고
    • Plano, TX, Technical Notes No. 99-101
    • Microfab Technologies Inc., Plano, TX, Technical Notes No. 99-101 Background on ink-jet technology (1999) http://www.microfab.com/ equipment/technotes/technote99-01.pdf.
    • (1999) Background on Ink-jet Technology
  • 44
    • 61849181168 scopus 로고    scopus 로고
    • International vocabulary of metrology - Basic and general concepts and associated terms (VIM)
    • International Organization for Standardization/International Electrotechnical Commission, Geneva, Switzerland
    • ISO/IEC Guide 99:2007. International vocabulary of metrology - Basic and general concepts and associated terms (VIM). International Organization for Standardization/International Electrotechnical Commission, Geneva, Switzerland.
    • (2007) ISO/IEC Guide , vol.99
  • 46
    • 70449735444 scopus 로고    scopus 로고
    • Unpublished work, National Institute of Standards and Technology, Gaithersburg, MD
    • Verkouteren, R. M.; Verkouteren, J. R. Unpublished work, National Institute of Standards and Technology, Gaithersburg, MD, 2009.
    • (2009)
    • Verkouteren, R.M.1    Verkouteren, J.R.2
  • 48
    • 65549151216 scopus 로고    scopus 로고
    • Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement
    • International Organization for Standardization/International Electrotechnical Commission, Geneva, Switzerland. See alsoTaylor B. N., Kuyatt C. E. Guidelines for Evaluating and Expressing Uncertainty of NIST Measurement Results. NIST Technical Note 1297, U.S. Government Printing Office: Washington, DC, 1994; available at
    • ISO/IEC Guide 98-3:2008 Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement. International Organization for Standardization/International Electrotechnical Commission, Geneva, Switzerland. See alsoTaylor B. N., Kuyatt C. E. Guidelines for Evaluating and Expressing Uncertainty of NIST Measurement Results. NIST Technical Note 1297, U.S. Government Printing Office: Washington, DC, 1994; available athttp://physics. nist.gov/Pubs/.
    • (2008) ISO/IEC Guide , vol.98 , Issue.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.