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Volumn , Issue , 2009, Pages 1039-1042

Adhesion behavior between epoxy molding compound and different leadframes in plastic packaging

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION BEHAVIORS; ADHESION STRENGTHS; C-MODE SCANNING ACOUSTIC MICROSCOPE; ELECTRONIC PACKAGING; EPOXY MOLDING COMPOUNDS; FAILURE PROBLEMS; INTERFACE ADHESION; KEY ELEMENTS; LEAD FRAME; METAL-COATED; MOISTURE ABSORPTION; PACKAGE PERFORMANCE; PLASTIC PACKAGES; PLASTIC PACKAGING; REFLOW PROCESS; SEM; VERTICAL PLANE;

EID: 70449916582     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2009.5270581     Document Type: Conference Paper
Times cited : (7)

References (7)
  • 1
    • 24644463370 scopus 로고    scopus 로고
    • A new method to Predict delamination in electronic packages
    • H. B. Fan, et al., "A new method to Predict delamination in electronic packages," Electronic Components and Technology Conference, 2005, pp. 145-150.
    • (2005) Electronic Components and Technology Conference , pp. 145-150
    • Fan, H.B.1
  • 2
    • 0035439607 scopus 로고    scopus 로고
    • Chemical and mechanical adhesion mechanisms of sputter-deposited metal on epoxy dielectric for high density interconnect printed circuit boards
    • Lara J. Martin, et al., "Chemical and mechanical adhesion mechanisms of sputter-deposited metal on epoxy dielectric for high density interconnect printed circuit boards," IEEE, 2000, pp.416-424.
    • (2000) IEEE , pp. 416-424
    • Martin, L.J.1
  • 3
    • 33748539358 scopus 로고    scopus 로고
    • Cell K. Y. Wong, Hongwei Gu, Bing Xu, and Matthew M.F. Yuen, A New Approach in Measuring Cu-EMC Adhesion Strength by AFM, Components and Packaging Technologies, 29, No.3, September 2006, pp. 543-550.
    • Cell K. Y. Wong, Hongwei Gu, Bing Xu, and Matthew M.F. Yuen, "A New Approach in Measuring Cu-EMC Adhesion Strength by AFM," Components and Packaging Technologies, VOL.29, No.3, September 2006, pp. 543-550.
  • 4
    • 77956535141 scopus 로고    scopus 로고
    • Effect of black oxide on interface adhesion between copper substrate & glob-top resin
    • M. Lebbai, et al., "Effect of black oxide on interface adhesion between copper substrate & glob-top resin," IEEE, 2000, pp. 61-69.
    • (2000) IEEE , pp. 61-69
    • Lebbai, M.1
  • 5
    • 0034476637 scopus 로고    scopus 로고
    • Interface adhesion between copper leadframe and epoxy moulding compound: Effect of surface finish, oxidation and dimples
    • Jang-Kyo KIM, et al., "Interface adhesion between copper leadframe and epoxy moulding compound: effect of surface finish, oxidation and dimples," Electronic Components and Technology Conference, 2000, pp. 601-608.
    • (2000) Electronic Components and Technology Conference , pp. 601-608
    • Jang-Kyo, K.I.M.1
  • 6
    • 41049105109 scopus 로고    scopus 로고
    • Stress Reduction of Epoxy Molding Compound and Its Effect on Delamination
    • Xinyu Du, Guangchao Xie, Wei Tan, Suqiong Qin and Xingming Cheng, "Stress Reduction of Epoxy Molding Compound and Its Effect on Delamination", Proceedings of HDP'07, 2007, pp. 50-54.
    • (2007) Proceedings of HDP'07 , pp. 50-54
    • Du, X.1    Xie, G.2    Tan, W.3    Qin, S.4    Cheng, X.5
  • 7
    • 84954199865 scopus 로고    scopus 로고
    • Teck-Gyu. Kang, Ik-Seong Park et al., Characterization of Oxidized Copper Leadframes and Copper/Epoxy Molding Compound Interface Adhesion in Plastic Package, IEEE, 1998, pp. 106-111.
    • Teck-Gyu. Kang, Ik-Seong Park et al., "Characterization of Oxidized Copper Leadframes and Copper/Epoxy Molding Compound Interface Adhesion in Plastic Package," IEEE, 1998, pp. 106-111.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.