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Volumn , Issue , 2009, Pages

A study of thermal performance for chip-in-substrate package on package

Author keywords

3D package; CiS packaging technology; FE analysis; Thermal performance

Indexed keywords

3-D PACKAGES; FE ANALYSIS; FINITE ELEMENTS; HEAT DISSIPATION; HIGH-DENSITY; HIGH-POWER; PACKAGING TECHNOLOGIES; POWER DISSIPATION; SOLDER BUMP; THERMAL PERFORMANCE; TYPE STRUCTURES;

EID: 70449775401     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (8)
  • 2
    • 0038142334 scopus 로고    scopus 로고
    • An Effective Methodology for Thermal Characterization of Electronic Packaging
    • W. H. Chen, H. C. Cheng and H. A. Shen, "An Effective Methodology for Thermal Characterization of Electronic Packaging," IEEE Trans on Components and Packaging Technologies, Vol. 26, No. 1 (2003), pp. 222-232.
    • (2003) IEEE Trans on Components and Packaging Technologies , vol.26 , Issue.1 , pp. 222-232
    • Chen, W.H.1    Cheng, H.C.2    Shen, H.A.3
  • 3
    • 30844455359 scopus 로고    scopus 로고
    • Thermal resistance analysis and validation of flip chip PBGA packages
    • .K. M. Chen, K. H. Houng and K. N. Chiang, "Thermal resistance analysis and validation of flip chip PBGA packages," Microelectronics Reliability, Vol. 46 (2006), pp. 440-448.
    • (2006) Microelectronics Reliability , vol.46 , pp. 440-448
    • Chen, K.M.1    Houng, K.H.2    Chiang, K.N.3
  • 4
    • 3843142736 scopus 로고    scopus 로고
    • Thermal Analysis of QFN Packages Using Finite Element Method
    • Brussels, Belgium, May
    • th EuroSimE, Brussels, Belgium, May 2004, pp. 499-503.
    • (2004) th EuroSimE , pp. 499-503
    • Chang, C.L.1    Hsieh, Y.Y.2
  • 5
    • 36348960588 scopus 로고    scopus 로고
    • A Study of Failure Mechanism and Reliability Assessment for the Panel Level Package (PLP) Technology
    • London, England, April
    • M. C. Yew, H. P. Wei, C. S. Huang, D. C. Hu, W. K. Yang and K. N. Chiang, "A Study of Failure Mechanism and Reliability Assessment for the Panel Level Package (PLP) Technology," Proc 8th EuroSimE, London, England, April 2007, pp. 475-482.
    • (2007) Proc 8th EuroSimE , pp. 475-482
    • Yew, M.C.1    Wei, H.P.2    Huang, C.S.3    Hu, D.C.4    Yang, W.K.5    Chiang, K.N.6
  • 6
    • 70450069059 scopus 로고    scopus 로고
    • EIA/JEDEC Standard, Test Boards for Area Array Surface Mount Package Thermal Measurements, Tech. Rep., EIA/JESD51-9, Arlington, VA, 2000.
    • EIA/JEDEC Standard, "Test Boards for Area Array Surface Mount Package Thermal Measurements," Tech. Rep., EIA/JESD51-9, Arlington, VA, 2000.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.