Characterization of order domains in-TiAl by orientation microscopy based on electron backscatter diffraction

Journal of Applied Crystallography

Volumn 42, Issue 6, 2009, Pages 1092-1101

  Zambaldi, Claudio ^a   Zaefferer, Stefan ^a   Wright, Stuart I ^b  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^b EDAX TSL   (United States)

Author keywords

AuCu prototypes; Backscattered Kikuchi diffraction patterns; Electron backscatter diffraction (EBSD); High resolution Hough transform; Order domain microstructure; Pseudosymmetry; TiAl

Indexed keywords

EID: 70449775079     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889809036498     Document Type: Article

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