On the capability of revealing the pseudosymmetry of the chalcopyrite-type crystal structure

Crystal Research and Technology

Volumn 43, Issue 3, 2008, Pages 234-239

  Abou Ras, D ^a   Gibmeier, J ^a   Nolze, G ^b   Gholinia, A ^c   Konijnenberg, P ^c  

^a HAHN MEITNER INSTITUT   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c OXFORD INSTRUMENTS PLASMA TECHNOLOGY   (United Kingdom)

Author keywords

Chalcopyrites; EBSD; Electron backscatter diffraction; Pseudosymmetry

Indexed keywords

BACKSCATTERING; COPPER COMPOUNDS; DIFFRACTION; ELECTRON DIFFRACTION; POWDERS; SOLIDS; SULFIDE MINERALS; TEXTURES; THICK FILMS; THIN FILM DEVICES; THIN FILMS; ZINC SULFIDE;

ACCURATE; ANGLE DISTRIBUTIONS; CHALCOPYRITES; CHEMICAL FORMULAS; DETECTION METHODS; EBSD; ELECTRON BACKSCATTER DIFFRACTION; IDEAL VALUES; MISORIENTATION; POLE FIGURES; PSEUDOSYMMETRY; STRUCTURE TYPES; TETRAGONAL CRYSTALS; TETRAGONALITY; TEXTURE MEASUREMENTS;

CRYSTAL STRUCTURE;

EID: 54949117928     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200711082     Document Type: Article

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