Reliable titanium aluminide texture measurement using EBSD

Materials Science Forum

Volumn 561-565, Issue PART 1, 2007, Pages 431-434

  Nave, Mark ^a,b   Inoue, Hirofumi ^c  

^a Microanalysis Consulting Pty Ltd   (Australia)

^b Oxford Instruments KK   (Japan)

^c Osaka Prefecture University   (Japan)

Author keywords

EBSD; Electron backscatter diffraction; Texture; TiAl; Titanium aluminide

Indexed keywords

ELECTRON DIFFRACTION; HOUGH TRANSFORMS; TEXTURES; X RAY DIFFRACTION ANALYSIS;

ELECTRON BACKSCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION PATTERNS (EBSPS); TEXTURE MEASUREMENT; TITANIUM ALUMINIDE;

TITANIUM COMPOUNDS;

EID: 38349155284     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-462-6.431     Document Type: Conference Paper

References (2)

1. X. Wu: Intermetallics Vol. 14 (2006), p. 1114.
2. H. Inoue and N. Inakazu: Proc. ICOTOM 11 (1996), p. 1495.