Automatic high-precision measurements of the location and width of Kikuchi bands in electron backscatter diffraction patterns

Journal of Microscopy

Volumn 190, Issue 3, 1998, Pages 375-391

  Krieger Lassen, N C ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Automation; Backscatter Kikuchi pattern; BKP; Crystal orientation; EBSD; EBSP; Electron backscatter diffraction; Electron backscattering pattern; Electron diffraction; Hough transform; Image processing; Kikuchi lines; Line detection; Pattern recognition

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; ELECTRONS; FEATURE EXTRACTION; HOUGH TRANSFORMS; IMAGE PROCESSING; INTERFEROMETRY; QUALITY CONTROL; RELIABILITY ANALYSIS;

BACKSCATTER KIKUCHI PATTERN; BKP; EBSD; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON BACKSCATTERING PATTERNS; IMAGES PROCESSING; KIKUCHI LINES; KIKUCHI PATTERNS; LINE DETECTION;

ELECTRON DIFFRACTION;

ACCURACY; ARTICLE; AUTOANALYSIS; ELECTRON DIFFRACTION; IMAGE PROCESSING; PRIORITY JOURNAL; RADIATION SCATTERING; RELIABILITY; SCANNING ELECTRON MICROSCOPY;

EID: 7144251855     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.00330.x     Document Type: Article

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