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Volumn 47, Issue 2, 2009, Pages 388-397

Atomistic simulations of the buckling behavior of perfect and defective silicon carbide nanotubes

Author keywords

Buckling; Defects; Effective Young's modulus; Molecular dynamics; Silicon carbide nanotubes

Indexed keywords

ANTI-SITE DEFECT; ATOMISTIC SIMULATIONS; AXIAL COMPRESSIVE LOAD; BUCKLING BEHAVIORS; BUCKLING LOADS; BUCKLING MODE; COMPUTATIONAL RESULTS; CRITICAL BUCKLING LOADS; EFFECT OF TEMPERATURE; EFFECTIVE YOUNG'S MODULUS; ENVIRONMENTAL TEMPERATURE; GLOBAL BUCKLING; LOAD CAPABILITY; LOCAL BUCKLING; MOLECULAR DYNAMICS METHODS; SIC NANOTUBES; SILICON CARBIDE NANOTUBES; TERSOFF POTENTIAL; TUBE DIAMETERS; VACANCY-TYPE DEFECTS; YOUNG'S MODULUS;

EID: 70449626844     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.commatsci.2009.08.017     Document Type: Article
Times cited : (38)

References (36)
  • 1
    • 0003597031 scopus 로고
    • INSPEC, Institution of Electrical Engineers, London
    • Harris G.L. Properties of Silicon Carbide (1995), INSPEC, Institution of Electrical Engineers, London
    • (1995) Properties of Silicon Carbide
    • Harris, G.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.