Electronic structure of silicon carbide polytypes studied by soft x-ray spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 16, 1999, Pages 10573-10582

  Luning J ^a,b   Eisebitt, S ^a   Rubensson, J E ^a,c   Ellmers, C ^a   Eberhardt, W ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b IBM ALMADEN RESEARCH CENTER   (United States)

^c UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001534567     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.10573     Document Type: Article

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