Silicon carbide nanotube tips: Promising materials for atomic force microscopy and/or scanning tunneling microscopy

Applied Physics Letters

Volumn 89, Issue 12, 2006, Pages

  Mavrandonakis, Andreas ^a   Froudakis, George E ^a   Andriotis, Antonis ^b   Menon, Madhu ^c  

^a UNIVERSITY OF CRETE   (Greece)

^b INSTITUTE OF COMPUTER SCIENCE   (Greece)

^c UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGHEST OCCUPIED MOLECULAR ORBITAL (HOMO); LOWEST UNOCCUPIED MOLECULAR ORBITAL (LUMO); SILICON CARBIDE NANOTUBES;

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; MOLECULAR STRUCTURE; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; STIFFNESS;

CARBON NANOTUBES;

EID: 33748965795     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2221418     Document Type: Article

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