A review of xilinx FPGA architectural reliability concerns from virtex to virtex-5

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2007, Pages

  Quinn, Heather ^a   Morgan, Keith ^a   Graham, Paul ^a   Krone, Jim ^a   Caffrey, Michael ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MODULAR REDUNDANCY; MULTIPLE BIT UPSET; XILINX FPGA;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

RADIATION EFFECTS;

EID: 70449602555     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2007.5205533     Document Type: Conference Paper

References (9)

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2. C. Carmichael, "Triple module redundancy design techniques for Virtex FPGAs," Xilinx Corporation, Tech. Rep., November 1, 2001, XAPP197 (v1.0).
3. H. Quinn, P. Graham, J. Krone, M. Caffrey, and S. Rezgui, "Radiation-induced multi-bit upsets in SRAM-based FPGAs," IEEE Transactions on Nuclear Science, vol. 52, no. 6, pp. 2455-2461, December 2005.
4. H. Quinn, K. Morgan, P. Graham, J. Krone, M. Caffrey, and K. Lundgreen, "Domain crossing errors: Limitations on single device triple-modular redundancy circuits in Xilinx FPGAs," IEEE Transactions on Nuclear Science, vol. 54, no. 6, pp. 2037-43,2007.
5. H. Quinn, K. Morgan, P. Graham, J. Krone, and M. Caffrey, "Static proton and heavy ion testing of the Xilinx Virtex-5 device," in The Proceedings of Data Workshop for Nuclear and Space Radiation Effects Conference, July 2007, pp. 177-184.
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7. "Xilinx TMRTool user guide," on web: http://www.xilinx. comlproducts/milaero/ugI56.pdf.
8. K. Morgan, M. Caffrey, P. Graham, E. Johnson, B. Pratt, and M. Wirthlin, "SEU-induced persistent error propagation in FPGAs," IEEE Transactions on Nuclear Science, vol. 52, no. 6, pp. 2438-45, 2005.
9. L. Sterpone and M. Violante, "Analysis of the robustness of the TMR architecture in SRAM-based FPGAs," IEEE Transactions on Nuclear Science, vol. 52, no. 5, pp. 1545-49, 2005.