Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 941-943

  Heile, A ^a   Lipinsky, D ^a   Wehbe, N ^b   Delcorte, A ^b   Bertrand, P ^b   Felten, A ^c   Houssiau, L ^c   Pireaux, J J ^c   De Mondt, R ^d   Van Vaeck, L ^d   Arlinghaus, H F ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c UNIVERSITY OF NAMUR   (Belgium)

^d UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Cluster bombardment; MetA SIMS; Near surface energy deposition; Polyatomic ions; Polymers; TOF SIMS

Indexed keywords

CHEMICAL MODIFICATION; DEPOSITION; INTERFACES (MATERIALS); ORGANIC POLYMERS; POLYMERS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

CLUSTER BOMBARDMENT; META-SIMS; NEAR-SURFACE ENERGY DEPOSITION; POLYATOMIC ION; TOF SIMS;

ION BOMBARDMENT;

EID: 56449119808     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.007     Document Type: Article

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