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Volumn 21, Issue 41, 2009, Pages 4139-4142

A characterization study of a nanowire-network transistor with various channel layers

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL LAYERS; CHARACTERIZATION STUDIES; FIELD DISTORTIONS; NETWORK TRANSISTORS; NUMBER OF LAYERS; TWO LAYERS; ZNO;

EID: 70449111378     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200900697     Document Type: Article
Times cited : (13)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.