Vickers indentation of thin GaAs (001) samples

Philosophical Magazine

Volumn 84, Issue 30, 2004, Pages 3281-3298

  Patriarche, G ^a   Largeau, L ^a   Riviere J P ^b   Bourhis, E L E ^c  

^a CNRS   (France)

^b Centre National de la Recherche Scientifique   (France)

^c UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLE FRACTURE; COMPUTER SIMULATION; ELECTRON BEAMS; HETEROJUNCTIONS; INDENTATION; PLASTIC FLOW; PLASTICITY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; VICKERS HARDNESS TESTING;

OPTOELECTRONIC STRUCTURES; PLASTIC RELAXATION; SELF STANDING STRUCTURES;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 7044264819     PISSN: 14786435     EISSN: None     Source Type: Journal    
DOI: 10.1080/14786430410001720381     Document Type: Article

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