Absolute determination of the asymmetry of the in-plane deformation of GaAs (001)

Journal of Applied Physics

Volumn 95, Issue 8, 2004, Pages 3984-3987

  Largeau, L ^a   Patriarche, G ^a   Glas, F ^a   Le Bourhis, E ^b  

^a UNIV PARIS SUD   (France)

^b UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ANNEALING; CRYSTAL GROWTH FROM MELT; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; HETEROJUNCTIONS; IMAGE ANALYSIS; INDENTATION; PLASTIC DEFORMATION; RELAXATION PROCESSES; TRANSMISSION ELECTRON MICROSCOPY;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); CRYSTAL POLARITY; MISORIENTATION; NANOINDENTATION TESTS; PLASTIC RELAXATION;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 2342636325     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1650891     Document Type: Article

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