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Volumn 82, Issue 8, 2002, Pages 1451-1462

Crystal polarity of sphalerite semiconductor compounds, as determined by convergent-beam electron diffraction experiments on plan-view (001) samples: Application to ZnSe crystals

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRON BEAMS; ELECTRON DIFFRACTION; ETCHING; VECTORS;

EID: 0037141685     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610208240030     Document Type: Article
Times cited : (11)

References (21)
  • 8
    • 85008800448 scopus 로고    scopus 로고
    • Institute of Physics Conference Series (Bristol: Institute of Physics) (to be published
    • Lavagne, S., Levadk, C., and Vanderschaeve, G., 2001, Microscopy of Semiconductor Materials 12, Institute of Physics Conference Series (Bristol: Institute of Physics) (to be published).
    • (2001) Microscopy of Semiconductor Materials , vol.12
    • Lavagne, S.1    Levadk, C.2    Vanderschaeve, G.3
  • 14
    • 85008836765 scopus 로고
    • Electron Diffraction
    • Lille, France: Université des sciences et techniques de Lille
    • Morniroli, J. P., 1994, Electron Diffraction, Dedicated Software to interpret CBED Patterns (Lille, France: Université des sciences et techniques de Lille).
    • (1994) Dedicated Software to Interpret CBED Patterns
    • Morniroli, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.