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Journal of Materials Science Letters

Volumn 20, Issue 14, 2001, Pages 1361-1364

Deformations of (0 1 1) GaAs under concentrated load

(4) Le Bourhis, E a Largeau, L b Patriarche, G b Riviere, J P c

a UNIVERSITÉ DE POITIERS (France)

b ORANGE LABS (France)

c URA 250 CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLENESS; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); DUCTILITY; FRACTURE TOUGHNESS; ION BEAMS; LOADS (FORCES); OPTICAL MICROSCOPY; PLASTIC DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY;

CONCENTERATED LOAD; FOCUSSED ION BEAMS (FIB);

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0035874687 PISSN: 02618028 EISSN: None Source Type: Journal
DOI: 10.1023/A:1010979324314 Document Type: Article

Times cited : (10)

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