Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence

Proceedings - Design Automation Conference

Volumn , Issue , 2009, Pages 154-159

  Veetil, Vineeth ^a   Sylvester, Dennis ^a   Blaauw, David ^a   Shah, Saumil ^b   Rochel, Steffen ^b  

^a The Department of Civil and Environmental Engineering   (United States)

^b Blaze DfM   (United States)

Author keywords

Monte Carlo; Statistical leakage; Variance reduction

Indexed keywords

COMPUTER AIDED DESIGN; DIES; DISTRIBUTION FUNCTIONS; LEAKAGE CURRENTS; THRESHOLD VOLTAGE;

ANALYTICAL APPROACH; LEAKAGE DISTRIBUTION; PROCESS PARAMETERS; PROCESS VARIATION; QUASI-MONTE CARLO; SEMICONDUCTOR DESIGN; STATISTICAL LEAKAGE ANALYSIS; VARIANCE REDUCTIONS;

MONTE CARLO METHODS;

EID: 70350708302     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1629911.1629956     Document Type: Conference Paper

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