Statistical multilayer process space coverage for at-speed test

Proceedings - Design Automation Conference

Volumn , Issue , 2009, Pages 340-345

  Xiong, Jinjun ^a   Shi, Yiyu ^b   Zolotov, Vladimir ^a   Visweswariah, Chandu ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Order statistics; Path selection; Process space coverage

Indexed keywords

COMPUTER AIDED DESIGN; MULTILAYERS;

EFFICIENT COMPUTATION; EXPONENTIAL COMPLEXITY; MULTILAYER PROCESS; ORDER STATISTICS; PATH SELECTION; PATH SELECTION ALGORITHMS; RECURSIVE ALGORITHMS; SPACE COVERAGE;

STATISTICS;

EID: 70350707909     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1629911.1630004     Document Type: Conference Paper

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